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RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

Beale, TAW; Hase, TPA; Iida, T; Endo, K; Steadman, P; Marshall, AR; Dhesi, SS; van der Laan, G; Hatton, PD

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TAW Beale

TPA Hase

T Iida

K Endo

P Steadman

AR Marshall

SS Dhesi

G van der Laan


We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (θ, 2θ, and χ) diffractometer with an additional removable rotation (ϕ) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.


Beale, T., Hase, T., Iida, T., Endo, K., Steadman, P., Marshall, A., …Hatton, P. (2010). RASOR: An advanced instrument for soft x-ray reflectivity and diffraction. Review of Scientific Instruments, 81(7), Article 073904.

Journal Article Type Article
Publication Date Jul 1, 2010
Deposit Date Sep 10, 2010
Publicly Available Date Oct 9, 2012
Journal Review of Scientific Instruments
Print ISSN 0034-6748
Electronic ISSN 1089-7623
Publisher American Institute of Physics
Peer Reviewed Peer Reviewed
Volume 81
Issue 7
Article Number 073904
Keywords Cryostats, X-ray diffractometeres, X-ray reflection, Resonant magnetic scattering, Active pixel sensor, Exchange Scattering, Bragg-diffractio, Multilayers, Anisotropy, Edges, Films, Iron.


Published Journal Article (1.2 Mb)

Copyright Statement
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Beale, T.A.W. and Hase, T.P.A. and Iida, T. and Endo, K. and Steadman, P. and Marshall, A.R. and Dhesi, S.S. and van der Laan, G. and Hatton, P.D. (2010) 'RASOR : an advanced instrument for soft x-ray reflectivity and diffraction.', Review of scientific instruments., 81 (7). 073904 and may be found at

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