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High-resolution AFM in liquid: what about the tip?

Voïtchovsky, K.

High-resolution AFM in liquid: what about the tip? Thumbnail



Atomic Force Microscopy relies on a nanoscale tip to image and probe samples, often down to the sub-nanometre level. The measurement process depends on the precise geometry and chemical nature of the tip apex, and is therefore difficult to control. In the current issue of Nanotechnology, Akrami and co-workers show that, for measurements in aqueous solutions and on flat samples, the presence of stable hydration sites at the tip apex is key to achieving high-resolution images. These sites can be created on commercial tips using a simple preparation strategy that prevents build-up of interfering contaminants. The findings by Akrami et al also suggest a possible way forward to control the influence of the tip on high-resolution measurements.


Voïtchovsky, K. (2015). High-resolution AFM in liquid: what about the tip?. Nanotechnology, 26(10), Article 100501.

Journal Article Type Article
Acceptance Date Feb 10, 2015
Publication Date Mar 13, 2015
Deposit Date Apr 20, 2015
Publicly Available Date Apr 27, 2015
Journal Nanotechnology
Print ISSN 0957-4484
Electronic ISSN 1361-6528
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 26
Issue 10
Article Number 100501


Accepted Journal Article (71 Kb)

Copyright Statement
This is an author-created, un-copyedited version of an article published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at

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