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Dynamic Bandwidth Slicing for Time-Critical IoT Data Streams in the Edge-Cloud Continuum

Habeeb, Fawzy; Alwasel, Khaled; Noor, Ayman; Jha, Devki Nandan; Alqattan, Duaa; Li, Yinhao; Aujla, Gagangeet Singh; Szydlo, Tomasz; Ranjan, Rajiv

Dynamic Bandwidth Slicing for Time-Critical IoT Data Streams in the Edge-Cloud Continuum Thumbnail


Fawzy Habeeb

Khaled Alwasel

Ayman Noor

Devki Nandan Jha

Duaa Alqattan

Yinhao Li

Tomasz Szydlo

Rajiv Ranjan


Edge computing has gained momentum in recent years, as complementary to cloud computing, for supporting applications (e.g. industrial control systems) that require Time-Critical communication guarantees. While edge computing can provide immediate analysis of streaming data from Internet of Things (IoT) devices, those devices lack computing capabilities to guarantee reasonable performance for Time-Critical applications. To alleviate this critical problem, the prevalent trend is to offload these data analytics tasks from the edge devices to the cloud. However, existing offloading approaches are static in nature as they are unable to adapt varying workload and network conditions. To handle these issues, we present a novel distributed and QoS-based multi-level queue traffic scheduling system that can undertake semi-automatic bandwidth slicing to process Time-Critical incoming traffic in the edge-cloud environments. Our developed system shows a great enhancement in latency and throughput as well as reduction in energy consumption for edge-cloud environments.


Habeeb, F., Alwasel, K., Noor, A., Jha, D. N., Alqattan, D., Li, Y., …Ranjan, R. (2022). Dynamic Bandwidth Slicing for Time-Critical IoT Data Streams in the Edge-Cloud Continuum. IEEE Transactions on Industrial Informatics, 18(11), 8017-8026.

Journal Article Type Article
Online Publication Date Apr 25, 2022
Publication Date 2022-11
Deposit Date May 6, 2022
Publicly Available Date May 6, 2022
Journal IEEE Transactions on Industrial Informatics
Print ISSN 1551-3203
Electronic ISSN 1941-0050
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 18
Issue 11
Pages 8017-8026


Accepted Journal Article (1.4 Mb)

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