MapChain: A Blockchain-based Verifiable Healthcare Service Management in IoT-based Big Data Ecosystem
Demirbaga, Umit; Aujla, Gagangeet Singh
Internet of Things (IoT)-based Healthcare services, which are becoming more widespread today, continuously generate huge amounts of data which is often called big data. Due to the magnitude and intricacy of the data, it is difficult to find valuable information that can be used for decision-making and prediction. Big data systems take on a significant infrastructure service to better serve the purpose of IoT systems and support critical decision making. On the other hand, privacy preservation, data integrity, and identity verification are essential requirements in healthcare big data service management. To overcome these problems, this article offers a scalable computing system that provides verifiable data access mechanism for IoT-enabled health data analytics in the big data ecosystem. There are two primary sub-architectures in the proposed architecture, namely a big data analytics tracking system and a derived blockchain-based data storage/access system. This approach leverages big data systems and blockchain architecture to analyze, and securely store data from IoT-enabled devices and allow verified access to the stored data. The zero-knowledge protocol is used to ensure that no information is accessible to unauthenticated users alongside avoiding data linkability. The results demonstrate the effectiveness of the our method to solve the problems of big data analytics and privacy issues in healthcare.
Demirbaga, U., & Aujla, G. S. (2022). MapChain: A Blockchain-based Verifiable Healthcare Service Management in IoT-based Big Data Ecosystem. IEEE Transactions on Network and Service Management, 19(4), 3896-3907. https://doi.org/10.1109/tnsm.2022.3204851
|Journal Article Type||Article|
|Online Publication Date||Sep 6, 2022|
|Deposit Date||Sep 21, 2022|
|Publicly Available Date||Sep 22, 2022|
|Journal||IEEE Transactions on Network and Service Management|
|Publisher||Institute of Electrical and Electronics Engineers|
|Peer Reviewed||Peer Reviewed|
Accepted Journal Article
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