Tanner, B., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M., Allen, D., McNally, P., …Danilewsky, A. (2016). X-ray asterism and the structure of cracks from indentations in silicon. Journal of Applied Crystallography, 49(1), 250-259. https://doi.org/10.1107/s1600576715024620