Shaw, A., Jin, J., Mitrovic, I., Hall, S., Wrench, J., & Chalker, P. (2017). Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements. Microelectronic Engineering, 178, 213-216. https://doi.org/10.1016/j.mee.2017.05.043