Ambrosini, S. F., Bowen, L., Mendis, B., Cirlin, G., Bouravleuv, A., Gallant, A., …Zeze, D. (2014). Novel TEM sample preparation using XeF2 selective Etching. MRS proceedings, 1659, 149-153. https://doi.org/10.1557/opl.2014.209